Rainbow-electronics DS2172 Instrukcja Użytkownika

Przeglądaj online lub pobierz Instrukcja Użytkownika dla Komunikacja Rainbow-electronics DS2172. Rainbow Electronics DS2172 User Manual Instrukcja obsługi

  • Pobierz
  • Dodaj do moich podręczników
  • Drukuj
  • Strona
    / 20
  • Spis treści
  • BOOKMARKI
  • Oceniono. / 5. Na podstawie oceny klientów
Przeglądanie stron 0
Copyright 1997 by Dallas Semiconductor Corporation.
All Rights Reserved. For important information regarding
patents and other intellectual property rights, please refer to
Dallas Semiconductor data books.
DS2172
Bit Error Rate Tester (BERT)
DS2172
031197 1/20
FEATURES
Generates/Detects digital bit patterns for analyzing,
evaluating and troubleshooting digital communica-
tions systems
Operates at speeds from DC to 52 MHz
Programmable polynomial length and feedback taps
for generation of any other pseudorandom pattern up
to 32 bits in length including: 2
6
–1, 2
9
–1, 2
11
–1,
2
15
–1, 2
20
–1, 2
23
–1, and 2
32
–1
Programmable user–defined pattern and length for
generation of any repetitive pattern up to 32 bits in
length
Large 32–bit error count and bit count registers
Software programmable bit error insertion
Fully independent transmit and receive sections
8–bit parallel control port
Detects test patterns with bit error rates up to 10
–2
PIN ASSIGNMENT
WR (R/W)
INT
VSS
LC
RL
RLOS
VDD
ALE (AS)
TL
AD0
AD1
TEST
VSS
AD2
AD3
AD4
AD5
AD6
AD7
VSS
VDD
BTS
RD (DS)
CS
TDATA
TDIS
TCLK
VSS
VDD
RCLK
RDIS
RDATA
DS2172
32–PIN TQFP
1
2
3
4
5
6
7
8
24
23
22
21
20
19
18
17
9 101112131415 16
32 31 30 29 28 27 26 25
DESCRIPTION
The DS2172 Bit Error Rate Tester (BERT) is a software
programmable test pattern generator, receiver, and
analyzer capable of meeting the most stringent error
performance requirements of digital transmission facili-
ties. Two categories of test pattern generation (Pseudo-
random and Repetitive) conform to CCITT/ITU O.151,
O.152, O.153, and O.161 standards. The DS2172
operates at clock rates ranging from DC to 52 MHz. This
wide range of operating frequency allows the DS2172 to
be used in existing and future test equipment, transmis-
sion facilities, switching equipment, multiplexers,
DACs, Routers, Bridges, CSUs, DSUs, and CPE equip-
ment.
The DS2172 user programmable pattern registers pro-
vide the unique ability to generate loopback patterns
required for T1, Fractional–T1, Smart Jack, and other
test procedures. Hence the DS2172 can initiate the
loopback, run the test, check for errors, and finally deac-
tivate the loopback.
The DS2172 consists of four functional blocks: the pat-
tern generator, pattern detector, error counter, and con-
trol interface. The DS2172 can be programmed to gen-
erate any pseudorandom pattern with length up to 2
32–1
bits (See Table 5, Note 9) or any user programmable bit
pattern from 1 to 32 bits in length. Logic inputs can be
used to configure the DS2172 for applications requiring
gap clocking such as Fractional–T1, Switched–56,
DDS, normal framing requirements, and per–channel
test procedures. In addition, the DS2172 can insert
single or 10
–1
to 10
–7
bit errors to verify equipment
operation and connectivity.
Przeglądanie stron 0
1 2 3 4 5 6 ... 19 20

Podsumowanie treści

Strona 1 - Bit Error Rate Tester (BERT)

Copyright 1997 by Dallas Semiconductor Corporation.All Rights Reserved. For important information regardingpatents and other intellectual property r

Strona 2 - 031197 2/20

DS2172031197 10/20PSEUDORANDOM PATTERN GENERATION (PCR.5=1) Table 4PATTERN TYPE PTR PLR PSR3 PSR2 PSR1 PSR0 TINV RINV23 – 1 00 02 FF FF FF FF 0 024 –

Strona 3

DS2172031197 11/20REPETITIVE PATTERN GENERATION (PCR.5=0) Table 5PATTERN TYPE PTR PLR PSR3 PSR2 PSR1 PSR0 TINV RINVall ones 00 00 FF FF FF FF 0 0all z

Strona 4 - 031197 4/20

DS2172031197 12/20BC15 BC14 BC13 BC12 BC11 BC10 BC9 BC8BC7 BC6 BC5 BC4 BC3 BC2 BC1 BC09.0 BIT ERROR COUNT REGISTERSThe Bit Error Count Registers (BE

Strona 5 - 031197 5/20

DS2172031197 13/20SR: STATUS REGISTER (Address=14 Hex)(MSB) (LSB)–RA1 RA0 RLOS BED BCOF BECOF SYNCSYMBOL POSITION NAME AND DESCRIPTION– SR.7 Not Assig

Strona 6 - 3.0 PATTERN SET REGISTERS

DS2172031197 14/2012.0 AC TIMING AND DC OPERATING CHARACTERISTICSABSOLUTE MAXIMUM RATINGS*Voltage on Any Pin Relative to Ground –1.0V to +7.0VOperatin

Strona 7 - 5.0 POLYNOMIAL TAP REGISTER

DS2172031197 15/20AC CHARACTERISTICS – PARALLEL PORT (0°C to 70°C; VDD=5V ± 10%)PARAMETER SYMBOL MIN TYP MAX UNITS NOTESCycle Time tCYC200 nsPulse Wid

Strona 8 - 6.0 PATTERN CONTROL REGISTER

DS2172031197 16/20INTEL BUS READ AC TIMING (BTS=0) Figure 3 tCYC tASED PWEH PWEL tCS PWASH tDDR tAHL tDHR tCH tASL tASD tASDALEWRRDCSAD0–AD7INTEL BUS

Strona 9 - ERROR BIT INSERTION Table 3

DS2172031197 17/20MOTOROLA BUS AC TIMING (BTS=1) Figure 5 tASED PWEH PWEL tCYC tDSW PWASHtASDtRWStRWHtDHRtDDRtAHLtASLtAHLtDHWtCHtASL tCSASDSR/WAD0–AD7

Strona 10 - 031197 10/20

DS2172031197 18/20AC CHARACTERISTICS – RECEIVE SIDE (0°C to 70°C; VDD=5V ± 10%)PARAMETER SYMBOL MIN TYP MAX UNITS NOTESRCLK Period tCP19 nsRCLK Pulse

Strona 11 - BIT COUNT REGISTERS

DS2172031197 19/20RECEIVE AC TIMING Figure 6 tR tF tSU1 tSU2 tHD1 tHD2 tWRL tCP tCH tCLRCLKRDATARDISRL/LCTRANSMIT AC TIMING Figure 7TCLKTDATATDISSEE N

Strona 12 - 031197 12/20

DS2172031197 2/201.0 GENERAL OPERATION1.1 Pattern GenerationThe DS2172 is programmed to generate a particulartest pattern by programming the followi

Strona 13 - 031197 13/20

DS2172031197 20/20DS2172 32–PIN TQFPGAUGE

Strona 14 - 031197 14/20

DS2172031197 3/20DS2172 FUNCTIONAL BLOCK DIAGRAM Figure 1BTS RD WR TEST ALE CS INT AD0–AD7PARALLEL CONTROL PORTPATTERNGENERATORERRORINSERTIONTRANSMITR

Strona 15 - =5V ± 10%)

DS2172031197 4/20DETAILED PIN DESCRIPTION Table 1PIN SYMBOL TYPE DESCRIPTION1 TL I Transmit Load. A positive–going edge loads the pattern generator w

Strona 16

DS2172031197 5/20PIN DESCRIPTIONTYPESYMBOL24 RL I Receive Load. A positive–going edge loads the previous 32 bits of datareceived at RDATA into the Pat

Strona 17

DS2172031197 6/20DS2172 REGISTER MAP Table 2ADDRESS R/W REGISTER NAME00 R/W Pattern Set Register 3.01 R/W Pattern Set Register 2.02 R/W Pattern Set Re

Strona 18

DS2172031197 7/20PATTERN SET REGISTERS (MSB) (LSB)PS31PS30 PS29 PS28 PS27 PS26 PS25 PS24PS23 PS22 PS21 PS20 PS19 PS18 PS17 PS16PS15 PS14 PS13 PS12

Strona 19 - TRANSMIT AC TIMING Figure 7

DS2172031197 8/20PT3 PTR.3 Polynomial Tap Bit 3.PT2 PTR.2 Polynomial Tap Bit 2.PT1 PTR.1 Polynomial Tap Bit 1.PT0 PTR.0 Polynomial Tap Bit 0.6.0

Strona 20 - DS2172 32–PIN TQFP

DS2172031197 9/207.0 ERROR INSERT REGISTERThe Error Insertion Register (EIR) controls circuitrywithin the DS2172 that allows the generated pattern to

Komentarze do niniejszej Instrukcji

Brak uwag